JAEA
  • help
  • PC | SP
  • JP | EN
          
Refine your search：     
Report No.
 - 
Clear All
Search Results: Records 1-3 displayed on this page of 3
  • 1

Presentation/Publication Type

Initialising ...

Refine

Journal/Book Title

Initialising ...

Meeting title

Initialising ...

First Author

Initialising ...

Keyword

Initialising ...

Language

Initialising ...

Publication Year

Initialising ...

Held year of conference

Initialising ...

Save select records

Journal Articles

Total-electron-yield X-ray standing-wave measurements of multilayer X-ray mirrors for interface structure evaluation

Muramatsu, Yasuji; Takenaka, Hisataka*; Gullikson, E. M.*; Perera, R. C. C.*

Japanese Journal of Applied Physics, Part 1, 41(6B), p.4250 - 4252, 2002/06

https://doi.org/10.1143/JJAP.41.4250
 Times Cited Count：9 Percentile：38.06(Physics, Applied)

no abstracts in English

Journal Articles

Evaluation methods of interlayer-structure-distribution in multilayers by total-electron-yield X-ray standing wave measurements

Muramatsu, Yasuji; Takenaka, Hisataka*; Gullikson, E. M.*; Perera, R. C. C.*

Advances in X-Ray Chemical Analysis, Japan, 33, p.145 - 154, 2002/00

no abstracts in English

Journal Articles

Total-electron-yeild X-ray standing wave measurements of multilayer X-ray mirrors

Muramatsu, Yasuji; Takenaka, Hisataka*; Gullikson, E. M.*; Perera, R. C. C.*

Advanced Light Source Compendium of User Abstracts 2000, 10 Pages, 2001/07

no abstracts in English

3 (Records 1-3 displayed on this page)
  • 1